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Image-Based Fractal Description of Microstructures J.M. Li Softcover reprint of hardcover 1st ed. 2003 edition
Image-Based Fractal Description of Microstructures
J.M. Li
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
285 pages, 215 black & white illustrations, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 7 december 2010 |
| ISBN13 | 9781441953704 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 272 |
| Afmetingen | 155 × 235 × 15 mm · 408 g |
| Taal en grammatica | Engels |