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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Erik Larsson 2005 edition
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
Erik Larsson
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
388 pages, biography
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 7 november 2005 |
| ISBN13 | 9781402032073 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 388 |
| Afmetingen | 156 × 232 × 23 mm · 1,09 kg |
| Taal en grammatica | Engels |