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Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Fangzhou Xia 2024 edition
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Fangzhou Xia
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).
370 pages, 200 Tables, color; 125 Illustrations, color; 13 Illustrations, black and white; XXIV, 370
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 7 februari 2024 |
| ISBN13 | 9783031442322 |
| Uitgevers | Springer International Publishing AG |
| Pagina's | 366 |
| Afmetingen | 150 × 220 × 20 mm · 823 g |
| Taal en grammatica | Duits |