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Principles of Analytical Electron Microscopy Joseph Goldstein Softcover reprint of the original 1st ed. 1986 edition
Principles of Analytical Electron Microscopy
Joseph Goldstein
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
468 pages, black & white illustrations
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 8 juli 2013 |
| ISBN13 | 9781489920393 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 448 |
| Afmetingen | 155 × 235 × 23 mm · 648 g |
| Taal en grammatica | Engels |
| Uitgever | Goldstein, Joseph |
| Uitgever | Joy, David C. |
| Uitgever | Romig Jr., Alton D. |