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Uitgaven door Meyer, J. Patrick (University of Virginia, USA)

25 juni 2014 – 27 juni 2014

Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Hardcover Book) (2014)
Hardcover Book
1e uitgave
Applied Measurement with jMetrik
Meyer, J. Patrick (University of...
Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Paperback Book) (2014)
Paperback Book
1e uitgave
Applied Measurement with jMetrik
Meyer, J. Patrick (University of...