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Defects and Properties of Semiconductors: Defect Engineering - Advances in Solid State Technology J Chikawa Softcover reprint of the original 1st ed. 1987 edition
Defects and Properties of Semiconductors: Defect Engineering - Advances in Solid State Technology
J Chikawa
Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
272 pages, black & white illustrations
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 25 december 2011 |
| ISBN13 | 9789401086165 |
| Uitgevers | Springer |
| Pagina's | 300 |
| Afmetingen | 152 × 229 × 14 mm · 367 g |
| Uitgever | Chikawa, J. |
| Uitgever | Sumino, K. |
| Uitgever | Wada, K. |