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High-Resolution Electron Microscopy for Materials Science Daisuke Shindo Softcover reprint of the original 1st ed. 1998 edition
High-Resolution Electron Microscopy for Materials Science
Daisuke Shindo
Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.
199 pages, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 1 september 1998 |
| ISBN13 | 9784431702344 |
| Uitgevers | Springer Verlag, Japan |
| Pagina's | 190 |
| Afmetingen | 279 × 210 × 16 mm · 516 g |
| Taal en grammatica | Engels Frans |