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Quantum Metrology, Imaging, and Communication - Quantum Science and Technology David S. Simon Softcover reprint of the original 1st ed. 2017 edition
Quantum Metrology, Imaging, and Communication - Quantum Science and Technology
David S. Simon
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
273 pages, 40 Tables, color; 68 Illustrations, color; 37 Illustrations, black and white; XII, 273 p.
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 4 juli 2018 |
| ISBN13 | 9783319835402 |
| Uitgevers | Springer International Publishing AG |
| Pagina's | 273 |
| Afmetingen | 150 × 220 × 10 mm · 408 g |
| Taal en grammatica | Duits |