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Quantum Metrology, Imaging, and Communication - Quantum Science and Technology David S. Simon 1st ed. 2017 edition
Quantum Metrology, Imaging, and Communication - Quantum Science and Technology
David S. Simon
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
273 pages, 37 black & white illustrations, 68 colour illustrations, 40 colour tables, biography
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 8 december 2016 |
| ISBN13 | 9783319465494 |
| Uitgevers | Springer International Publishing AG |
| Pagina's | 273 |
| Afmetingen | 242 × 164 × 21 mm · 620 g |
| Taal en grammatica | Frans |