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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin Softcover reprint of the original 1st ed. 1986 edition
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 8 juni 2013 |
| ISBN13 | 9781475790290 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 454 |
| Afmetingen | 152 × 229 × 24 mm · 630 g |
| Taal en grammatica | Engels |
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