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Advances in X-Ray Analysis: Volume 33 Softcover reprint of the original 1st ed. 1990 edition
Advances in X-Ray Analysis: Volume 33
The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.
724 pages, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 2 juni 2012 |
| ISBN13 | 9781461399988 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 704 |
| Afmetingen | 150 × 220 × 10 mm · 1,14 kg |
| Taal en grammatica | Engels |
| Uitgever | Barrett, Charles S. |
| Uitgever | Gilfrich, John V. |
| Uitgever | Huang, Ting C. |
| Uitgever | Jenkins, Ron |