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Advances in X-ray Analysis: Volume 20 Mcmurdie Softcover reprint of the original 1st ed. 1977 edition
Advances in X-ray Analysis: Volume 20
Mcmurdie
X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment.
621 pages, 171 black & white illustrations, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 12 december 2012 |
| ISBN13 | 9781461399834 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 604 |
| Afmetingen | 178 × 254 × 32 mm · 1,07 kg |
| Taal en grammatica | Engels |
| Uitgever | McMurdie, Howard |
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