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Thermal Testing of Integrated Circuits J. Altet Softcover reprint of the original 1st ed. 2002 edition
Thermal Testing of Integrated Circuits
J. Altet
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
204 pages, 102 black & white illustrations, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 21 september 2011 |
| ISBN13 | 9781441952875 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 204 |
| Afmetingen | 155 × 235 × 12 mm · 322 g |
| Taal en grammatica | Engels |