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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization Alvin W Czanderna 1st ed. Softcover of orig. ed. 1999 edition
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization
Alvin W Czanderna
The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
449 pages, 70 black & white illustrations, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 6 december 2010 |
| ISBN13 | 9781441932990 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 430 |
| Afmetingen | 152 × 229 × 23 mm · 625 g |
| Taal en grammatica | Engels |
| Uitgever | Czanderna, Alvin W. |
| Uitgever | Madey, Theodore E. |
| Uitgever | Powell, Cedric J. |
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