Vertel uw vrienden over dit artikel:
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Adam Foster
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
282 pages, biography
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 23 november 2010 |
| ISBN13 | 9781441923066 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 282 |
| Afmetingen | 155 × 235 × 16 mm · 417 g |
| Taal en grammatica | Engels |
Meer door Adam Foster
Alles tonenMere med samme udgiver
Bekijk alles van Adam Foster ( bijv. CD , Paperback Book en Hardcover Book )