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Multi-chip Module Test Strategies - Frontiers in Electronic Testing Reprinted from Journal of Electronic Testing, 10:1 edition
Yervant Zorian
Multi-chip Module Test Strategies - Frontiers in Electronic Testing Reprinted from Journal of Electronic Testing, 10:1 edition
Yervant Zorian
This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.
167 pages, biography
Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
Vrijgegeven | 31 mei 1997 |
ISBN13 | 9780792399209 |
Uitgevers | Kluwer Academic Publishers |
Pagina's | 167 |
Afmetingen | 203 × 254 × 11 mm · 535 g |
Taal en grammatica | Engels |
Uitgever | Zorian, Yervant |
Bekijk alles van Yervant Zorian ( bijv. Hardcover Book )