Vertel uw vrienden over dit artikel:
Hierarchical Modeling for VLSI Circuit Testing - The Springer International Series in Engineering and Computer Science 1990 edition
Debashis Bhattacharya
Prijs
€ 119,99
Besteld in een afgelegen magazijn
Verwachte levering 27 nov. - 6 dec.
Onze klanten zeggen:
Voeg toe aan uw iMusic-verlanglijst
Hierarchical Modeling for VLSI Circuit Testing - The Springer International Series in Engineering and Computer Science 1990 edition
Debashis Bhattacharya
To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel.
160 pages, biography
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 31 december 1989 |
| ISBN13 | 9780792390589 |
| Uitgevers | Springer |
| Pagina's | 160 |
| Afmetingen | 155 × 235 × 11 mm · 426 g |
| Taal en grammatica | Engels |
Alles tonen
Meer door Debashis Bhattacharya
![Cover for Debashis Bhattacharya · Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science (Paperback Book) [Softcover Reprint of the Original 1st Ed. 1990 edition] (2011)](https://imusic.b-cdn.net/images/item/original/190/9781461288190.jpg?debashis-bhattacharya-2011-hierarchical-modeling-for-vlsi-circuit-testing-the-springer-international-series-in-engineering-and-computer-science-paperback-book&class=scaled&v=1611602835)
Bekijk alles van Debashis Bhattacharya ( bijv. DVD , Hardcover Book , Paperback Book en CD )