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2000 European Test Workshop (Etw) IEEE Postproceed Ieee
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2000 European Test Workshop (Etw) IEEE Postproceed
Ieee
The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 1 november 2000 |
| ISBN13 | 9780769507019 |
| Uitgevers | IEEE Computer Society Press,U.S. |
| Pagina's | 181 |
| Afmetingen | 216 × 273 × 13 mm · 650 g (Gewicht (geschat)) |
| Taal en grammatica | Engels |
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