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Focused Ion Beam Systems: Basics and Applications Nan Yao
Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, black & white illustrations
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 14 april 2011 |
| ISBN13 | 9780521158596 |
| Uitgevers | Cambridge University Press |
| Pagina's | 408 |
| Afmetingen | 169 × 246 × 24 mm · 668 g |
| Taal en grammatica | Engels |
| Uitgever | Yao, Nan (Princeton University, New Jersey) |