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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Greg Haugstad
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Greg Haugstad
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).
488 pages, Illustrations
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 16 oktober 2012 |
| ISBN13 | 9780470638828 |
| Uitgevers | John Wiley & Sons Inc |
| Pagina's | 528 |
| Afmetingen | 163 × 244 × 31 mm · 794 g |
| Taal en grammatica | Engels |
Bekijk alles van Greg Haugstad ( bijv. Hardcover Book )