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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 12 augustus 2025 |
| ISBN13 | 9789819659449 |
| Uitgevers | Springer Nature Switzerland AG |
| Pagina's | 186 |
| Afmetingen | 150 × 220 × 20 mm · 453 g |
| Uitgever | Evans, Paul G. |
| Uitgever | Sando, Daniel |
| Uitgever | Valanoor, Nagarajan |