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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience Jian Min Zuo 1st ed. 2017 edition
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
Jian Min Zuo
As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
755 pages, 92 black & white illustrations, 218 colour illustrations, biography
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 26 oktober 2016 |
| ISBN13 | 9781493966059 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 729 |
| Afmetingen | 155 × 235 × 44 mm · 1,37 kg |
| Taal en grammatica | Engels |
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