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Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems Amith Singhee 2010 edition
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems
Amith Singhee
This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs.
246 pages, biography
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 17 september 2010 |
| ISBN13 | 9781441966056 |
| Uitgevers | Springer-Verlag New York Inc. |
| Genre | Aspects (Academic) > Science / Technology Aspects |
| Pagina's | 246 |
| Afmetingen | 155 × 235 × 15 mm · 539 g |
| Taal en grammatica | Engels |
| Uitgever | Rutenbar, Rob A. |
| Uitgever | Singhee, Amith |
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