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Microelectronic Reliability Vol. I: Test Edward B. Hakim
Microelectronic Reliability Vol. I: Test
Edward B. Hakim
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
396 pages, 1, black & white illustrations
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 31 januari 1989 |
| ISBN13 | 9780890062845 |
| Uitgevers | Artech House Publishers |
| Pagina's | 396 |
| Afmetingen | 161 × 238 × 30 mm · 771 g |
| Uitgever | Hakim, Edward B. |
Kerstcadeautjes kunnen tot en met 31 januari worden ingewisseld