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Electron Microscopy and Analysis Peter J. Goodhew 3e uitgave
Electron Microscopy and Analysis
Peter J. Goodhew
A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.
254 pages, 147 colour illustrations
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 30 november 2000 |
| ISBN13 | 9780748409686 |
| Uitgevers | Taylor & Francis Ltd |
| Pagina's | 264 |
| Afmetingen | 236 × 157 × 16 mm · 420 g |
| Taal en grammatica | Engels |
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